Marina M. Alioto
Joves i Ciência Program, Spain
Abstract
The VOS model for the evolution of topological defect networks allows for time-varying tensions, which may affect network scaling solutions. We compare analogous solutions for different defects, checking results against numerical integration of the VOS equations.
2026 July 24, 13:30
IA/U.Porto
Centro de Astrofísica da Universidade do Porto (Classroom)
Rua das Estrelas, 4150-762 Porto





